!main_tags!Binomial Distribution - Statistics | What's Your IQ !main_header!

Definition

Concept

Binomial distribution: models number of successes in n independent Bernoulli trials. Each trial: two outcomes (success/failure). Probability of success: constant p. Trials independent.

Formal Statement

Random variable X ~ Binomial(n, p). X counts successes in n trials.

Conditions

Fixed number of trials, identical success probability, independence, binary outcome.

Properties

Discrete Distribution

Defined on integer values k = 0, 1,..., n. Probability mass assigned to each k.

Support

Support: {0, 1, 2, ..., n}. Probability outside support is zero.

Symmetry

Symmetric if p = 0.5; otherwise skewed left (p > 0.5) or right (p < 0.5).

Probability Mass Function (PMF)

Formula

PMF gives P(X = k) for k successes:

P(X = k) = C(n, k) p^k (1-p)^{n-k}

Binomial Coefficient

C(n, k) = n! / (k! (n-k)!) number of ways to choose k successes.

Interpretation

Probability of exactly k successes in n trials, each success independent with probability p.

Parameters

Number of Trials (n)

Integer ≥ 1. Defines number of independent experiments.

Probability of Success (p)

Real number in [0,1]. Probability of success in each trial.

Parameter Space

Parameter vector: θ = (n, p). Fixed n, p constant across trials.

Mean and Variance

Expected Value

Mean (μ) = np. Average number of successes.

Variance

Variance (σ²) = np(1-p). Measures spread around mean.

Standard Deviation

σ = sqrt(np(1-p)).

Parameter Formula
Mean (μ) np
Variance (σ²) np(1-p)

Cumulative Distribution Function (CDF)

Definition

CDF F(k) = P(X ≤ k) = Σ_{i=0}^k P(X = i).

Calculation

Summation of PMF values from 0 up to k.

Use Cases

Probability at most k successes, hypothesis testing, confidence intervals.

Moment Generating Function (MGF)

Formula

M_X(t) = E[e^{tX}] = (1 - p + p e^t)^n

Usage

Derive moments (mean, variance) by differentiation.

Properties

MGF uniquely characterizes distribution.

Applications

Quality Control

Defect count in batch inspection, pass/fail testing.

Genetics

Inheritance pattern probabilities, allele frequencies.

Survey Sampling

Number of positive responses in fixed sample.

Reliability Engineering

Component failure count in system tests.

Examples

Coin Toss

Number of heads in 10 tosses of a fair coin: n=10, p=0.5.

Manufacturing Defects

Defects in 100 products, defect rate 2% (p=0.02).

Exam Passes

Number passing in class of 50 with pass probability 0.7.

Scenario n p Interpretation
Coin toss heads 10 0.5 Number of heads
Manufacturing defects 100 0.02 Defective items count
Exam passes 50 0.7 Students passing exam

Approximations

Normal Approximation

For large n, np and n(1-p) ≥ 5, Binomial approximated by Normal(μ=np, σ²=np(1-p)). Continuity correction recommended.

Poisson Approximation

For large n, small p, with np = λ fixed, approximates Binomial by Poisson(λ).

Use Cases

Simplifies calculations, enables use of continuous distribution tools.

Parameter Estimation

Maximum Likelihood Estimation (MLE)

Given observed k successes in n trials, MLE for p is k/n.

Confidence Intervals

Use normal approximation or exact Clopper-Pearson intervals for p.

Bayesian Estimation

Beta prior conjugate; posterior is Beta(α + k, β + n - k).

Limitations

Independence Assumption

Trials must be independent; dependence invalidates model.

Constant Probability

Probability p must not vary between trials.

Binary Outcomes Only

Only two possible outcomes per trial allowed.

Fixed Number of Trials

n must be predetermined and fixed.

References

  • Feller, W. "An Introduction to Probability Theory and Its Applications," Vol. 1, Wiley, 1968, pp. 152-160.
  • Casella, G., Berger, R.L. "Statistical Inference," 2nd ed., Duxbury, 2002, pp. 237-244.
  • Ross, S.M. "Introduction to Probability Models," 11th ed., Academic Press, 2014, pp. 58-65.
  • Meyer, P.L. "Introductory Probability and Statistical Applications," Addison-Wesley, 1970, pp. 120-125.
  • Johnson, N.L., Kemp, A.W., Kotz, S. "Univariate Discrete Distributions," 3rd ed., Wiley, 2005, pp. 46-60.
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